AR10-NCH

ID 804.NS.AR10-NCH

Silicon probe with high aspect ratio tip (>10) for deep trench imaging.

Each pack contains 10 probes.
This product is not in stock but you can order and it will take around two weeks to get delivered.

$ 1,335.00

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Description Details

Description

f = 330 kHz | k = 42 N/m | tip coating: none

High Aspect Ratio (> 10:1) - Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ AR10-NCH AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

The probe offers unique features:

Length of the high aspect ratio portion of the tip > 1.5 µm
Typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along cantilever axis)
Half cone angle at 1.5 µm of the high aspect ratio portion typically < 2.8°
Guaranteed tip radius of curvature < 15 nm
Monolithic tip
Highly doped silicon to dissipate static charge
High mechanical Q-factor for high sensitivity